Low-voltage scanning electron microscopy of multilayer polymer systems
- 作者: Orekhov A.S.1,2, Klechkovskaya V.V.2, Kononova S.V.3
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隶属关系:
- National Research Centre “Kurchatov Institute”
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”
- Institute of Macromolecular Compounds
- 期: 卷 62, 编号 5 (2017)
- 页面: 710-715
- 栏目: Structure of Organic Compounds
- URL: https://journals.rcsi.science/1063-7745/article/view/191284
- DOI: https://doi.org/10.1134/S1063774517050145
- ID: 191284
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详细
The possibilities of low-voltage scanning electron microscopy for visualization of specific features of the microstructure in internal layers of multilayer polymer films are demonstrated by the example of “chitosan–polyelectrolyte complex–alginic acid” composite. The process of electron beam interaction with a sample at low electron energies is considered. The key parameters of low-voltage electron microscopy, which make it possible to increase the resolution of SEM images of polymer systems, are discussed.
作者简介
A. Orekhov
National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”
Email: klechvv@ns.crys.ras.ru
俄罗斯联邦, Moscow, 123182; Moscow, 119333
V. Klechkovskaya
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”
编辑信件的主要联系方式.
Email: klechvv@ns.crys.ras.ru
俄罗斯联邦, Moscow, 119333
S. Kononova
Institute of Macromolecular Compounds
Email: klechvv@ns.crys.ras.ru
俄罗斯联邦, St. Petersburg, 199004
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