Characteristics of chloride memristors based on nanothick metal films
- Authors: Rozanov R.Y.1, Kondrashov V.A.1, Nevolin V.K.1, Chaplygin Y.A.1
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Affiliations:
- National Research University of Electronic Technology (MIET)
- Issue: Vol 45, No 1 (2016)
- Pages: 26-32
- Section: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/185512
- DOI: https://doi.org/10.1134/S1063739716010091
- ID: 185512
Cite item
Abstract
Memristors based on films of Cu and Cr, as well as their chlorides, which provide better characteristics of electronic components compared to the commonly used ones, are investigated.
About the authors
R. Yu. Rozanov
National Research University of Electronic Technology (MIET)
Email: vkn@miee.ru
Russian Federation, Zelenograd
V. A. Kondrashov
National Research University of Electronic Technology (MIET)
Author for correspondence.
Email: vkn@miee.ru
Russian Federation, Zelenograd
V. K. Nevolin
National Research University of Electronic Technology (MIET)
Email: vkn@miee.ru
Russian Federation, Zelenograd
Yu. A. Chaplygin
National Research University of Electronic Technology (MIET)
Email: vkn@miee.ru
Russian Federation, Zelenograd