电邮这篇文章 Characteristics of chloride memristors based on nanothick metal films
- 作者: Rozanov R.Y.1, Kondrashov V.A.1, Nevolin V.K.1, Chaplygin Y.A.1
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隶属关系:
- National Research University of Electronic Technology (MIET)
- 期: 卷 45, 编号 1 (2016)
- 页面: 26-32
- 栏目: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/185512
- DOI: https://doi.org/10.1134/S1063739716010091
- ID: 185512
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详细
Memristors based on films of Cu and Cr, as well as their chlorides, which provide better characteristics of electronic components compared to the commonly used ones, are investigated.
作者简介
R. Rozanov
National Research University of Electronic Technology (MIET)
Email: vkn@miee.ru
俄罗斯联邦, Zelenograd
V. Kondrashov
National Research University of Electronic Technology (MIET)
编辑信件的主要联系方式.
Email: vkn@miee.ru
俄罗斯联邦, Zelenograd
V. Nevolin
National Research University of Electronic Technology (MIET)
Email: vkn@miee.ru
俄罗斯联邦, Zelenograd
Yu. Chaplygin
National Research University of Electronic Technology (MIET)
Email: vkn@miee.ru
俄罗斯联邦, Zelenograd
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