Emission Theory of the Sputtering of Amorphous Materials: Self-Sputtering


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The dependences of the coefficient of self-sputtering on the type of accelerated ions, their energy, and the angle of incidence on a target are calculated. Satisfactory coincidence between the calculated and experimental results is obtained for С–С and W–W systems. Two mechanisms of the entry of secondary particles into a flow of sputtered atoms are proposed.

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A. Pustovit

Institute of Microelectronics Technology and High Purity Materials

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Email: pustan@ipmt-hpm.ac.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432

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