Determination of mass absorption coefficient in two-layer thin-film Cr/V and V/Cr systems by X-ray fluorescence spectrometry
- 作者: Mashin N.1, Krylov E.1, Chernyaeva E.1, Ershov A.1, Zimina E.1
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隶属关系:
- Lobachevsky State University of Nizhny Novgorod
- 期: 卷 72, 编号 11 (2017)
- 页面: 1167-1171
- 栏目: Articles
- URL: https://journals.rcsi.science/1061-9348/article/view/182676
- DOI: https://doi.org/10.1134/S1061934817090064
- ID: 182676
如何引用文章
详细
A method is proposed for the determination of mass absorption coefficient in the analysis of two-layer thin-film V/Cr and Cr/V systems on Polikor substrates by X-ray fluorescence spectrometry. Simply fabricated and unified film layers formed by applying vanadium and chromium on polymer film substrates are used. Correction coefficients taking into account the attenuation of primary radiation of X-ray tube and analytical line of an element from the lower layer in the upper layer are calculated.
作者简介
N. Mashin
Lobachevsky State University of Nizhny Novgorod
编辑信件的主要联系方式.
Email: mashin@chem.unn.ru
俄罗斯联邦, Nizhny Novgorod, 603950
E. Krylov
Lobachevsky State University of Nizhny Novgorod
Email: mashin@chem.unn.ru
俄罗斯联邦, Nizhny Novgorod, 603950
E. Chernyaeva
Lobachevsky State University of Nizhny Novgorod
Email: mashin@chem.unn.ru
俄罗斯联邦, Nizhny Novgorod, 603950
A. Ershov
Lobachevsky State University of Nizhny Novgorod
Email: mashin@chem.unn.ru
俄罗斯联邦, Nizhny Novgorod, 603950
E. Zimina
Lobachevsky State University of Nizhny Novgorod
Email: mashin@chem.unn.ru
俄罗斯联邦, Nizhny Novgorod, 603950