Determination of mass absorption coefficient in two-layer thin-film Cr/V and V/Cr systems by X-ray fluorescence spectrometry
- Autores: Mashin N.1, Krylov E.1, Chernyaeva E.1, Ershov A.1, Zimina E.1
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Afiliações:
- Lobachevsky State University of Nizhny Novgorod
- Edição: Volume 72, Nº 11 (2017)
- Páginas: 1167-1171
- Seção: Articles
- URL: https://journals.rcsi.science/1061-9348/article/view/182676
- DOI: https://doi.org/10.1134/S1061934817090064
- ID: 182676
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Resumo
A method is proposed for the determination of mass absorption coefficient in the analysis of two-layer thin-film V/Cr and Cr/V systems on Polikor substrates by X-ray fluorescence spectrometry. Simply fabricated and unified film layers formed by applying vanadium and chromium on polymer film substrates are used. Correction coefficients taking into account the attenuation of primary radiation of X-ray tube and analytical line of an element from the lower layer in the upper layer are calculated.
Sobre autores
N. Mashin
Lobachevsky State University of Nizhny Novgorod
Autor responsável pela correspondência
Email: mashin@chem.unn.ru
Rússia, Nizhny Novgorod, 603950
E. Krylov
Lobachevsky State University of Nizhny Novgorod
Email: mashin@chem.unn.ru
Rússia, Nizhny Novgorod, 603950
E. Chernyaeva
Lobachevsky State University of Nizhny Novgorod
Email: mashin@chem.unn.ru
Rússia, Nizhny Novgorod, 603950
A. Ershov
Lobachevsky State University of Nizhny Novgorod
Email: mashin@chem.unn.ru
Rússia, Nizhny Novgorod, 603950
E. Zimina
Lobachevsky State University of Nizhny Novgorod
Email: mashin@chem.unn.ru
Rússia, Nizhny Novgorod, 603950