Determination of mass absorption coefficient in two-layer thin-film Cr/V and V/Cr systems by X-ray fluorescence spectrometry
- Авторлар: Mashin N.1, Krylov E.1, Chernyaeva E.1, Ershov A.1, Zimina E.1
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Мекемелер:
- Lobachevsky State University of Nizhny Novgorod
- Шығарылым: Том 72, № 11 (2017)
- Беттер: 1167-1171
- Бөлім: Articles
- URL: https://journals.rcsi.science/1061-9348/article/view/182676
- DOI: https://doi.org/10.1134/S1061934817090064
- ID: 182676
Дәйексөз келтіру
Аннотация
A method is proposed for the determination of mass absorption coefficient in the analysis of two-layer thin-film V/Cr and Cr/V systems on Polikor substrates by X-ray fluorescence spectrometry. Simply fabricated and unified film layers formed by applying vanadium and chromium on polymer film substrates are used. Correction coefficients taking into account the attenuation of primary radiation of X-ray tube and analytical line of an element from the lower layer in the upper layer are calculated.
Авторлар туралы
N. Mashin
Lobachevsky State University of Nizhny Novgorod
Хат алмасуға жауапты Автор.
Email: mashin@chem.unn.ru
Ресей, Nizhny Novgorod, 603950
E. Krylov
Lobachevsky State University of Nizhny Novgorod
Email: mashin@chem.unn.ru
Ресей, Nizhny Novgorod, 603950
E. Chernyaeva
Lobachevsky State University of Nizhny Novgorod
Email: mashin@chem.unn.ru
Ресей, Nizhny Novgorod, 603950
A. Ershov
Lobachevsky State University of Nizhny Novgorod
Email: mashin@chem.unn.ru
Ресей, Nizhny Novgorod, 603950
E. Zimina
Lobachevsky State University of Nizhny Novgorod
Email: mashin@chem.unn.ru
Ресей, Nizhny Novgorod, 603950