Use of Dependence of the Edge Effect and X-Ray Focusing for the Interpretation of X-Ray Diffraction Patterns

Аннотация

It is experimentally shown that the edge effect and corresponding X-ray diffraction focusing can be observed simultaneously using a system with two thin blocks (μt < 1) and a narrow air gap (nondiffraction zone). A condition for achieving high-resolution Moiré patterns in two-block systems is found. The correlation between the edge effect and focusing in two-block systems is revealed.