Email this article Use of Dependence of the Edge Effect and X-Ray Focusing for the Interpretation of X-Ray Diffraction Patterns
- Authors: Drmeyan H.R.1
-
Affiliations:
- Institute of Applied Problems of Physics, National Academy of Sciences of Armenia
- Issue: Vol 13, No 3 (2019)
- Pages: 508-510
- Section: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/196341
- DOI: https://doi.org/10.1134/S102745101903025X
- ID: 196341
Cite item
Open Access
Access granted
Subscription Access
Abstract
It is experimentally shown that the edge effect and corresponding X-ray diffraction focusing can be observed simultaneously using a system with two thin blocks (μt < 1) and a narrow air gap (nondiffraction zone). A condition for achieving high-resolution Moiré patterns in two-block systems is found. The correlation between the edge effect and focusing in two-block systems is revealed.
Keywords
About the authors
H. R. Drmeyan
Institute of Applied Problems of Physics, National Academy of Sciences of Armenia
Author for correspondence.
Email: drm-henrik@mail.ru
Armenia, Gyumri, 3126
Supplementary files
