On the effect of lead concentration on the kinetics of contact melting in the Sn–Pb–Bi system in the presence of electromigration


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It is determined by electron microscopy that the contact layer in the Sn–(Bi + 30 wt % Pb) system contains separate solid inclusions, while the contact layer in the Sn–(Bi + 40 wt % Pb) system is microheterogeneous. The observed structural states of alloys in the contact layers are explained by a change in the concentration of the initial contacting samples. The effect of the alloy structure and electromigration on the kinetics of contact melting is found.

作者简介

V. Afashokov

Kabardino-Balkarian State University

Email: boris_khubolov@rambler.ru
俄罗斯联邦, Nalchik, Kabardino-Balkaria, 360004

A. Akhkubekov

Kabardino-Balkarian State University

Email: boris_khubolov@rambler.ru
俄罗斯联邦, Nalchik, Kabardino-Balkaria, 360004

S. Akhkubekova

Kabardino-Balkarian State University

Email: boris_khubolov@rambler.ru
俄罗斯联邦, Nalchik, Kabardino-Balkaria, 360004

M.-A. Zubkhadjiev

Kabardino-Balkarian State University

Email: boris_khubolov@rambler.ru
俄罗斯联邦, Nalchik, Kabardino-Balkaria, 360004

B. Khubolov

Kabardino-Balkarian State University

编辑信件的主要联系方式.
Email: boris_khubolov@rambler.ru
俄罗斯联邦, Nalchik, Kabardino-Balkaria, 360004

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