Analysis of the composition of graphene-oxide films using a backscattered H+ ion beam

详细

The O/C atomic ratios in films of oxidized and partially reduced graphene oxide are determined via the Rutherford backscattering of H⁺ ions. In addition, the conductivity σ is measured. It is established that the reduction noticeably decreases the О/С ratio and increases σ by a few orders of magnitude. We demonstrate for the first time the efficiency of Rutherford backscattering in studying graphene-type objects.