Intrinsic excitation effect for the Al and Mg samples XPS analysis
- Авторы: Afanas’ev V.P.1, Gryazev A.S.1, Kaplya P.S.1, Andreyeva Y.O.1
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Учреждения:
- National Research University “Moscow Power Engineering Institute,”
- Выпуск: Том 10, № 1 (2016)
- Страницы: 108-112
- Раздел: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/187799
- DOI: https://doi.org/10.1134/S102745101506004X
- ID: 187799
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Аннотация
DIIMFP extraction method based on the numerical solution of electron scattering is presented. DIIMFP data extracted from Reflected Electron Energy Loss Spectra (REELS) is used for Photoelectron spectroscopy (PES) calculations. Experimental data can be described accurately without any intrinsic excitation effect. Authors propose that intrinsic energy losses were introduced to face inaccuracies due to inadequate description of electron energy loss process.
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Об авторах
V. Afanas’ev
National Research University “Moscow Power Engineering Institute,”
Email: GryazevAS@gmail.com
Россия, st. Krasnokazarmennaya 14, Moscow, 111250
A. Gryazev
National Research University “Moscow Power Engineering Institute,”
Автор, ответственный за переписку.
Email: GryazevAS@gmail.com
Россия, st. Krasnokazarmennaya 14, Moscow, 111250
P. Kaplya
National Research University “Moscow Power Engineering Institute,”
Email: GryazevAS@gmail.com
Россия, st. Krasnokazarmennaya 14, Moscow, 111250
Y. Andreyeva
National Research University “Moscow Power Engineering Institute,”
Email: GryazevAS@gmail.com
Россия, st. Krasnokazarmennaya 14, Moscow, 111250
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