Intrinsic excitation effect for the Al and Mg samples XPS analysis
- Авторлар: Afanas’ev V.P.1, Gryazev A.S.1, Kaplya P.S.1, Andreyeva Y.O.1
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Мекемелер:
- National Research University “Moscow Power Engineering Institute,”
- Шығарылым: Том 10, № 1 (2016)
- Беттер: 108-112
- Бөлім: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/187799
- DOI: https://doi.org/10.1134/S102745101506004X
- ID: 187799
Дәйексөз келтіру
Аннотация
DIIMFP extraction method based on the numerical solution of electron scattering is presented. DIIMFP data extracted from Reflected Electron Energy Loss Spectra (REELS) is used for Photoelectron spectroscopy (PES) calculations. Experimental data can be described accurately without any intrinsic excitation effect. Authors propose that intrinsic energy losses were introduced to face inaccuracies due to inadequate description of electron energy loss process.
Негізгі сөздер
Авторлар туралы
V. Afanas’ev
National Research University “Moscow Power Engineering Institute,”
Email: GryazevAS@gmail.com
Ресей, st. Krasnokazarmennaya 14, Moscow, 111250
A. Gryazev
National Research University “Moscow Power Engineering Institute,”
Хат алмасуға жауапты Автор.
Email: GryazevAS@gmail.com
Ресей, st. Krasnokazarmennaya 14, Moscow, 111250
P. Kaplya
National Research University “Moscow Power Engineering Institute,”
Email: GryazevAS@gmail.com
Ресей, st. Krasnokazarmennaya 14, Moscow, 111250
Y. Andreyeva
National Research University “Moscow Power Engineering Institute,”
Email: GryazevAS@gmail.com
Ресей, st. Krasnokazarmennaya 14, Moscow, 111250
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