Study of Resonance Phenomena During Thin-Film Perforation upon the Passage of Multicharged Ions


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

The process of the perforation of a nanometer-thick film during passage of the wave packet of a multicharged ion is studied. It is shown that the resonant behavior of vibrations of the disk released from the film has a significant effect on the perforation process. The resonance mechanism is based on the “push-pull” process. A model of the strength of the polarization interaction between the film and the wave packet of the particle is proposed. The model makes it possible to estimate the threshold value of the force required to form a pore during the passage of a multicharged ion through the film.

Авторлар туралы

G. Filippov

Moscow State Open University Cheboksary Polytechnic Institute

Хат алмасуға жауапты Автор.
Email: filippov38-gm@yandex.ru
Ресей, Cheboksary, 428000

V. Aleksandrov

Ulianov Chuvash State University

Email: filippov38-gm@yandex.ru
Ресей, Cheboksary, 428000

A. Stepanov

Chuvash State Agricultural Academy

Email: filippov38-gm@yandex.ru
Ресей, Cheboksary, 428000

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML

© Pleiades Publishing, Ltd., 2019