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Monte Carlo Method in Scanning Electron Microscopy. 2. Problems and Solutions
Novikov Y.A.
Monte Carlo method in scanning electron microscopy. 1. Modeling and experiment
Novikov Y.A.
Investigation of the surface of antifriction Al–Cu–Si–Sn–Pb aluminum alloys
Stolyarova O.O., Muravyeva T.I., Zagorskiy D.L., Gubenko M.M.
Monte Carlo Method in Scanning Electron Microscopy. 3. Modern Condition of the Problem
Novikov Y.A.
Investigation of the local characteristics of amorphous electrical steel
Virus A.A., Kaminskaya T.P., Stepovich M.A., Korovushkin V.V., Shipko M.N., Tikhonov A.I., Popov V.V.
Formation of SEM Images in the Secondary Electron Mode. 2. Structures with a Trapezoidal Profile and Small Side-Wall Inclinations
Novikov Y.A.
Optimization of the Electron Optical System of a Scanning Electron Microscope for Measuring the Size of Micro- and Nanoobjects
Kazmiruk V.V., Kurganov I.G., Podkopaev A.A., Savitskaya T.N.
Influence of the Substrate Type on the Surface Morphology of Cu2ZnSnSe4 Thin Films
Baraishuk S.M., Tkachenko T.M., Stanchik A.V., Gremenok V.F., Bashkirov S.A., Wiertel M., Budzynski M., Turovets A.I., Yakovenko Y.S.
Calibration of a scanning electron microscope from two coordinates
Novikov Y.A.
Investigation of the closed porosity of functional ceramic materials by spin-echo small-angle neutron scattering
Pavlov K.A., Velichko E.V., Zabenkin V.N., Kraan W.H., Duif C.P., Bouwman W.G., Mikhailovskaya Z.A., Buyanova E.S., Grigoriev S.V.
Effect of the substrate material on the structure of carbon nanomaterials upon synthesis in a plasma jet reactor
Shavelkina M.B., Amirov R.H., Vorobyeva N.A., Katarzhis V.A.
First results of the application of scanning XRF analysis with synchrotron-radiation beams from the VEPP-3 to study the spatial distribution of trace elements in samples of stratiform chromite ores
Darin A.V., Veksler I.V., Rakshun Y.V.
Atоmiс Force Microscopy of Graphene-Like Films Deposited onto Preirradiated SiO2/Si
Sedlovets D.M., Knyazev M.A., Trofimov O.V.
X-Ray Diffraction and Differential Scanning Calorimetry Studies of Crystalline and Amorphous Regions in Composite Porous Films
Lazarev S.I., Golovin Y.M., Polikarpov V.M., Shestakov K.V.
Synthesis of Rhenium-Silicide Microcrystals in a Tin Melt
Solomkin F.Y., Orekhov A.S., Sharenkova N.V., Khavrov G.D., Isachenko G.N., Zaitseva N.V., Klechkovskaya V.V.
On the Precision Preparation of Samples for Atom Probe Tomography Using a Focused Ion Beam in a SEM
Khoroshilov V.V., Korchuganova O.A., Lukyanchuk A.A., Raznitsyn O.A., Aleev A.A., Rogozhkin S.V.
Estimation of the diameter of a SEM beam by video-signal curves from a trapezoidal Structure: 2. Experiment
Larionov Y.V.
High-resolution X-ray diffractometry and transmission electron microscopy as applied to the structural study of InAlAs/InGaAs/InAlAs multilayer transistor nanoheterostructures
Galiev G.B., Klimov E.A., Imamov R.M., Ganin G.V., Pushkarev S.S., Maltsev P.P., Zhigalina O.M., Orekhov A.S., Vasil’ev A.L., Presniakov M.Y., Trunkin I.N.
Estimation of the SEM beam diameter by video-signal curves from a trapezoidal structure: 1. Simulation experiment
Larionov Y.V.
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y.S., Borgardt N.I., Lazarenko P.I., Parsegova V.S., Prikhodko A.S., Sherchenkov A.A.
Analysis of the Structure and Composition of Fe2O3 Oxides Subjected to Magnetic Pulse Treatment
Virus A.A., Shipko M.N., Stepovich M.A., Kaminskaya T.P., Korovushkin V.V., Tikhonov A.I., Savchenko E.S.
Microstructural Effects in Electron-Microscopic Studies of Carbonate Rocks
Kuzmin V.A.
Test Object for SEM Calibration. 1. Methods for Quality Control of Manufacturing
Novikov Y.A.
Fabrication of nitrogen-containing coatings in reed switches by pulsed ion-plasma treatment
Zeltser I.A., Gurov V.S., Rybin N.B., Tolstogouzov A., Fu D.J., Kumar P.
Investigation of the heat resistance of zirconia coatings generated by microarc oxidation
Savushkina S.V., Polyansky M.N., Borisov A.M., Vinogradov A.V., Lyudin V.B., Dankova T.E., Agureev L.E.
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