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Vol 11, No 2 (2017)
Investigation of X-ray diffraction limitations upon the analysis of tellurium-atom injection into GaAs epitaxial layers
Drozdov Y.N., Danil’tsev V.M., Drozdov M.N., Yunin P.A., Demidov E.V., Folomin P.I., Gritsenko A.B., Korolev S.A., Surovegina E.A.
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(Eng)
Vol 10, No 1 (2016)
On the use of an external reference sample in the X-ray diffraction analysis of epitaxial layers
Drozdov Y.N., Yunin P.A.
PDF
(Eng)
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