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Vol 12, No 1 (2018)
On the Precision Preparation of Samples for Atom Probe Tomography Using a Focused Ion Beam in a SEM
Khoroshilov V.V., Korchuganova O.A., Lukyanchuk A.A., Raznitsyn O.A., Aleev A.A., Rogozhkin S.V.
PDF
(Eng)
Vol 10, No 5 (2016)
Electron and probe microscopy investigation of the surface of elastomers modified with antifriction fillers
Stolyarova O.O., Muravyeva T.I., Gainutdinov R.V., Morozov A.V., Zagorskiy D.L., Petrova N.N., Portnyagina V.V.
PDF
(Eng)
Vol 13, No 6 (2019)
On Estimating the Heating of the Surface of a Homogeneous Metal Target with a Low-Energy Electron Probe
Amrastanov A.N., Seregina E.V., Stepovich M.A.
PDF
(Eng)
Vol 11, No 5 (2017)
Investigation of the local characteristics of amorphous electrical steel
Virus A.A., Kaminskaya T.P., Stepovich M.A., Korovushkin V.V., Shipko M.N., Tikhonov A.I., Popov V.V.
PDF
(Eng)
Vol 11, No 4 (2017)
Investigation of the surface of antifriction Al–Cu–Si–Sn–Pb aluminum alloys
Stolyarova O.O., Muravyeva T.I., Zagorskiy D.L., Gubenko M.M.
PDF
(Eng)
Vol 12, No 1 (2018)
Analysis of the Three-Dimensional Model of Diffusion of Minority Charge Carriers Generated by an Electron Probe in a Heterogeneous Semiconductor Material by Means of Projection Methods
Seregina E.V., Stepovich M.A., Makarenkov A.M.
PDF
(Eng)
Vol 11, No 5 (2017)
On the possibility of using the Galerkin projection method to model the spatial distribution of minority charge carriers generated by an electron probe in a semiconductor
Seregina E.V., Stepovich M.A., Makarenkov A.M., Filippov M.N.
PDF
(Eng)
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