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Crystal Structure of the Intermetallic Thin-Film Cu–Sn Condensate
Makrushina A.N., Plotnikov V.A., Demyanov B.F., Makarov S.V.
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y.S., Borgardt N.I., Lazarenko P.I., Parsegova V.S., Prikhodko A.S., Sherchenkov A.A.
Influence of the Substrate Type on the Surface Morphology of Cu2ZnSnSe4 Thin Films
Baraishuk S.M., Tkachenko T.M., Stanchik A.V., Gremenok V.F., Bashkirov S.A., Wiertel M., Budzynski M., Turovets A.I., Yakovenko Y.S.
Determination of the Thickness of Thin Films Based on Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis
Sokolov S.A., Milovanov R.A., Sidorov L.N.
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