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Title
Authors
Vol 13, No 6 (2019)
Morphological and Optical Properties of Cu1 –xZnxO Nanoparticles
Srinivasan N.
PDF
(Eng)
Vol 12, No 3 (2018)
Study of the Microstructure, Crystallographic Structure and Thermal Stability of Al–Ti–Nb Alloys Produced by Selective Electron Beam Alloying
Valkov S., Neov D., Bezdushnyi R., Beskrovnyi A., Kozlenko D., Petrov P.
PDF
(Eng)
Vol 13, No 5 (2019)
Formation of SEM Images in the Secondary Electron Mode. 2. Structures with a Trapezoidal Profile and Small Side-Wall Inclinations
Novikov Y.A.
PDF
(Eng)
Vol 12, No 1 (2018)
On the Precision Preparation of Samples for Atom Probe Tomography Using a Focused Ion Beam in a SEM
Khoroshilov V.V., Korchuganova O.A., Lukyanchuk A.A., Raznitsyn O.A., Aleev A.A., Rogozhkin S.V.
PDF
(Eng)
Vol 13, No 5 (2019)
Atоmiс Force Microscopy of Graphene-Like Films Deposited onto Preirradiated SiO2/Si
Sedlovets D.M., Knyazev M.A., Trofimov O.V.
PDF
(Eng)
Vol 11, No 6 (2017)
Test Object for SEM Calibration. 1. Methods for Quality Control of Manufacturing
Novikov Y.A.
PDF
(Eng)
Vol 13, No 5 (2019)
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y.S., Borgardt N.I., Lazarenko P.I., Parsegova V.S., Prikhodko A.S., Sherchenkov A.A.
PDF
(Eng)
Vol 11, No 5 (2017)
HPHT single crystal diamond type IIB growth sector influence on the secondary electron emission phenomenon
Sadovoy V., Blank V., Teteruk D., Terentiev S., Kornilov N.
PDF
(Eng)
Vol 13, No 4 (2019)
Formation of SEM Images in the Slow Secondary Electron Mode. 1. Structures with Large Side Wall Inclinations
Novikov Y.A.
PDF
(Eng)
Vol 11, No 4 (2017)
Calibration of a scanning electron microscope from two coordinates
Novikov Y.A.
PDF
(Eng)
Vol 13, No 2 (2019)
Simulation of the Properties of Betavoltaic Cells Based on Silicon and 63Ni Enriched Film
Polikarpov M.A., Yakimov E.B.
PDF
(Eng)
Vol 11, No 1 (2017)
Using electron backscatter diffraction to investigate the influence of mechanical polishing on the state of the surface of diamond
Korostylev E.V., Bormashov V.S., Tarelkin S.A., Doronin M.A.
PDF
(Eng)
Vol 12, No 6 (2018)
Test Object for SEM Calibration: 2. Correlation Analysis of SEM Signals
Novikov Y.A.
PDF
(Eng)
Vol 10, No 6 (2016)
Estimation of the diameter of a SEM beam by video-signal curves from a trapezoidal Structure: 2. Experiment
Larionov Y.V.
PDF
(Eng)
Vol 13, No 6 (2019)
Test Objects with a Rectangular Profile for SEM: 1. Fabrication Technology
Novikov Y.A.
PDF
(Eng)
Vol 12, No 3 (2018)
Monte Carlo Method in Scanning Electron Microscopy. 3. Modern Condition of the Problem
Novikov Y.A.
PDF
(Eng)
1 - 16 of 16 Items

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