Issue |
Title |
File |
Vol 11, No 1 (2017) |
Current status and development prospects for multilayer X-ray optics at the Institute for Physics of Microstructures, Russian Academy of Sciences |
|
Akhsakhalyan A.D., Kluenkov E.B., Lopatin A.Y., Luchin V.I., Nechay A.N., Pestov A.E., Polkovnikov V.N., Salashchenko N.N., Svechnikov M.V., Toropov M.N., Tsybin N.N., Chkhalo N.I., Shcherbakov A.V.
|
Vol 10, No 2 (2016) |
Cyclotron dynamics of electron wave packets in topological insulators in an external magnetic field |
|
Frolova E.V., Kravets N.A.
|
Vol 12, No 1 (2018) |
Damage of an Ultrasonic-Waveguide Surface during Cavitation Accompanied by Sonoluminescence |
|
Biryukov D.A., Val’yano G.E., Gerasimov D.N.
|
Vol 13, No 1 (2019) |
Degradation of the Optical Properties of Zinc-Oxide Micropowders and Nanopowders under Proton and Electron Irradiation |
|
Neshchimenko V.V., Chundong L., Mikhailov M.M.
|
Vol 11, No 6 (2017) |
Dependence of Synthetic Diamond Wear Rate on Lattice Orientation at Traditional Mechanical Treatment |
|
Doronin M.A., Larionov K.V., Troschiev S.Y., Terentiev S.A.
|
Vol 13, No 6 (2019) |
Dependence of the Degree of Reinforcement of Polymer/2D-Nanofiller Nanocomposites on the Nanofiller Surface Structure |
|
Kozlov G.V., Dolbin I.V.
|
Vol 13, No 3 (2019) |
Dependence of the Elastic Modulus on the Size and Shape of an Argon Nanocrystal |
|
Magomedov M.N.
|
Vol 13, No 6 (2019) |
Dependence of the Kinetics of Radiation-Induced Defect Formation on the Energy Absorbed by Si and SiC when Exposed to Fast Charged Particles |
|
Kozlovski V.V., Vasil’ev A.E., Emtsev V.V., Oganesyan G.A., Lebedev A.A.
|
Vol 12, No 1 (2018) |
Depth Distribution of Residual Fluorine in a Polyvinylidene Fluoride Film under Electron Bombardment |
|
Zhivulin V.E., Pesin L.A., Zherebtsov D.A., Sidelnikova A.L.
|
Vol 10, No 3 (2016) |
Depth of origin of sputtered particles under the oblique incidence of a primary ion beam |
|
Pustovit A.N.
|
Vol 13, No 2 (2019) |
Depth Profiling of Layered Si−O−Al Thin Films with Secondary Ion Mass Spectrometry and Rutherford Backscattering Spectrometry |
|
Bachurin V.I., Melesov N.S., Mironenko A.A., Parshin E.O., Rudy A.S., Simakin S.G., Churilov A.B.
|
Vol 12, No 6 (2018) |
Depth Profiling Using Reflected Electron Spectroscopy |
|
Afanas’ev V.P., Bodisko Y.N., Gryazev A.S., Kaplya P.S., Fedorovich S.D.
|
Vol 13, No 2 (2019) |
Description of the Charge–Energy Distribution of Fast Ions |
|
Novikov N.V., Teplova Y.A.
|
Vol 13, No 2 (2019) |
Description of the Energy Losses of Heavy Ions in Carbon As a Function of Their Velocity |
|
Belkova Y.A., Teplova Y.A.
|
Vol 13, No 5 (2019) |
Design of a Single-Crystal Diffractometer for the PIK Reactor |
|
Bykov A.A., Smirnov O.P.
|
Vol 10, No 3 (2016) |
Determination of the characteristics of the spectra of neutron scattering for tungsten using the wavelet transform |
|
Goroshko M.A., Stepanov S.E.
|
Vol 11, No 1 (2017) |
Determination of the element distribution in films deposited using the plasma focus facility by Rutherford backscattering |
|
Kolokoltsev V.N., Kulikauskas V.S., Bondarenko G.G., Eriskin A.A., Nikulin V.Y., Silin P.V.
|
Vol 13, No 5 (2019) |
Determination of the Relative Concentration of Deuterium Implanted into Beryllium by Elastic Peak Electron Spectroscopy |
|
Afanas’ev V.P., Gryazev A.S., Kaplya P.S., Köppen M., Rybakova A.V.
|
Vol 12, No 6 (2018) |
Determination of the Thickness of Nanofilms Using X-Ray Photoelectron Spectroscopy |
|
Kaplya P.S., Efremenko D.S., Afanas’ev V.P.
|
Vol 13, No 5 (2019) |
Determination of the Thickness of Thin Films Based on Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis |
|
Sokolov S.A., Milovanov R.A., Sidorov L.N.
|
Vol 13, No 1 (2019) |
Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy |
|
Dunaevskiy M.S., Alekseev P.A., Geydt P., Lahderanta E., Haggren T., Lipsanen H.
|
Vol 10, No 3 (2016) |
Determining the potential based on Rutherford backscattering data and electron screening in nuclear fusion reactions |
|
Zinoviev A.N., Meluzova D.S.
|
Vol 10, No 3 (2016) |
Deuterium accumulation in beryllium under irradiation with powerful pulsed plasma flows |
|
Efimov V.S., Gasparyan Y.M., Pisarev A.A., Kupriyanov I.B., Porezanov N.P.
|
Vol 11, No 2 (2017) |
Development and study of a conceptual model of an X-ray source with a field emission cathode |
|
Djuzhev N.A., Makhiboroda M.A., Preobrazhensky R.Y., Demin G.D., Gusev E.E., Dedkova A.A.
|
Vol 13, No 6 (2019) |
Development of a Broadband Double Monochromator based on Multilayer Supermirrors for Hard X-Ray Spectroscopy on High-Intensity Beams |
|
Serebrennikov D.A., Dikaya O.A., Maksimova K.Y., Goikhman A.Y., Clementyev E.S.
|
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