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Vol 11, No 5 (2017)
TEM Study of the microstructure of melt grown FeGe2 single crystals
Bunkin A.Y., Kolosov V.Y., Papushina T.I.
PDF
(Eng)
Vol 11, No 4 (2017)
Application of ion implantation for the modification of silicon-on-sapphire epitaxial systems, their structure, and properties
Aleksandrov P.A., Demakov K.D., Shemardov S.G., Belova N.E.
PDF
(Eng)
Vol 11, No 1 (2017)
Effect of Co+-ion implantation on the composition and properties of free Si–Cu nanofilm structures
Isakhanov Z.A., Kodirov T., Halmatov A.S., Ruzibaeva M.K., Muhtarov Z.E., Umirzakov B.E.
PDF
(Eng)
Vol 10, No 6 (2016)
Estimation of the diameter of a SEM beam by video-signal curves from a trapezoidal Structure: 2. Experiment
Larionov Y.V.
PDF
(Eng)
Vol 10, No 5 (2016)
Analysis of the oscillation intensity of RHEED specular reflection during the MBE growth of CaF2/Si/CaF2 structures
Velichko A.A., Ilyushin V.A., Krupin A.U., Gavrilenko V.A., Filimonova N.I.
PDF
(Eng)
Vol 10, No 4 (2016)
Wear resistance of the surface layers of hard alloys with a multilevel structural phase state
Solonenko O.P., Ulianitsky V.Y., Byeli A.V., Bao H.Y., Zhang H., Ovcharenko V.E., Ivanov Y.F., Mohovikov A.A., Ivanov K.V.
PDF
(Eng)
Vol 10, No 1 (2016)
Model conductivity calculations for a system of quantum dots
Aleksandrov V.A., Sabirov A.S., Filippov G.M.
PDF
(Eng)
Vol 13, No 6 (2019)
Atomic Structure Probing of Thin Metal Films via Vacuum Holographic Microscopy
Egorov N.V., Antonova L.I., Trofimov V.V., Gileva A.Y.
PDF
(Eng)
Vol 13, No 3 (2019)
Electron Spectroscopy of Thin Nanocarbon Films
Nishchak O.Y., Savchenko N.F., Streletsky O.A., Khvostov V.V., Zykova E.Y.
PDF
(Eng)
Vol 12, No 5 (2018)
Comparison between the Results of Simulating the Synchrotron Radiation from a Bending Magnet and Experimental Data
Harisova A.E., Shkitov D.A., Novokshonov A.I., Sutygina Y.N.
PDF
(Eng)
Vol 12, No 3 (2018)
Structure and Surface Morphology of Cd1–xMnxSe Epitaxial Films
Nuriyev I.R., Mehrabova M.A., Hasanov N.H.
PDF
(Eng)
Vol 12, No 1 (2018)
Analysis of the Three-Dimensional Model of Diffusion of Minority Charge Carriers Generated by an Electron Probe in a Heterogeneous Semiconductor Material by Means of Projection Methods
Seregina E.V., Stepovich M.A., Makarenkov A.M.
PDF
(Eng)
Vol 11, No 6 (2017)
Investigation of the Structure and Functional Properties of Diamond-Like Coatings Obtained by Physical Vapor Deposition
Vysotina E.A., Kazakov V.A., Polyansky M.N., Savushkina S.V., Sivtsov K.I., Sigalaev S.K., Lyakhovetsky M.A., Mironova S.A., Zilova O.S.
PDF
(Eng)
Vol 11, No 5 (2017)
On the possibility of using the Galerkin projection method to model the spatial distribution of minority charge carriers generated by an electron probe in a semiconductor
Seregina E.V., Stepovich M.A., Makarenkov A.M., Filippov M.N.
PDF
(Eng)
Vol 11, No 4 (2017)
Study of hafnium-oxide coatings by means of nuclear backscattering spectrometry
Borisov A.M., Polyanskiy M.N., Savushkina S.V., Laptev I.N., Dankova T.E., Tkachenko N.V., Vostrikov V.G., Kamenskih A.I.
PDF
(Eng)
Vol 11, No 2 (2017)
Development and study of a conceptual model of an X-ray source with a field emission cathode
Djuzhev N.A., Makhiboroda M.A., Preobrazhensky R.Y., Demin G.D., Gusev E.E., Dedkova A.A.
PDF
(Eng)
Vol 10, No 6 (2016)
Features of the surface morphology of CaF2/Si(100) films obtained by solid-phase epitaxy
Ilyushin V.A., Velichko A.A., Krupin A.Y., Gavrilenko V.A., Savinov A.N., Katzuba A.V.
PDF
(Eng)
Vol 10, No 5 (2016)
Differential inverse inelastic mean free path determination on the base of X-ray photoelectron emission spectra
Afanas’ev V.P., Gryazev A.S., Efremenko D.S., Kaplya P.S., Lyapunov N.V.
PDF
(Eng)
Vol 10, No 3 (2016)
Determining the potential based on Rutherford backscattering data and electron screening in nuclear fusion reactions
Zinoviev A.N., Meluzova D.S.
PDF
(Eng)
Vol 13, No 6 (2019)
Electron-Microscopy Studies of Microstructural Features of the Pore Space in Polymictic Sandstones
Kuzmin V.A., Skibitskaya N.A.
PDF
(Eng)
Vol 13, No 5 (2019)
Determination of the Thickness of Thin Films Based on Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis
Sokolov S.A., Milovanov R.A., Sidorov L.N.
PDF
(Eng)
Vol 13, No 2 (2019)
Modeling of the Influence of the Thickness of an Insulating Film on a Cathode Surface on its Effective Secondary-Electron Emission Yield in Low-Current Gas Discharge
Kristya V.I., Ha M.T., Fisher M.R.
PDF
(Eng)
Vol 12, No 5 (2018)
Modification of Zinc-Implanted Silicon by Swift Xenon Ion Irradiation
Privezentsev V.V., Skuratov V.A., Kulikauskas V.S., Makunin A.V., Ksenich S.V., Steinman E.A., Tereshchenko A.N., Goryachev A.V.
PDF
(Eng)
Vol 12, No 3 (2018)
Influence of High Energy Impact on the Structural-Phase State and Tribological Properties of the Surface Layer of Metal-Ceramic Composite Materials
Ivanov K.V., Ivanov Y.F., Mohovikov A.A., Ovcharenko V.E.
PDF
(Eng)
Vol 12, No 1 (2018)
Depth Distribution of Residual Fluorine in a Polyvinylidene Fluoride Film under Electron Bombardment
Zhivulin V.E., Pesin L.A., Zherebtsov D.A., Sidelnikova A.L.
PDF
(Eng)
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