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Sputtering of Silicon Single Crystals under Irradiation with a Helium and Argon Ion Beam with an Average Energy of 1 keV
Volkov N.V., Safonov D.A.
Influence of the Substrate Type on the Surface Morphology of Cu2ZnSnSe4 Thin Films
Baraishuk S.M., Tkachenko T.M., Stanchik A.V., Gremenok V.F., Bashkirov S.A., Wiertel M., Budzynski M., Turovets A.I., Yakovenko Y.S.
Influence of Oxygen Vacancies on the Magnetic Properties of Zn1 – xCoxOy Films
Lotin A.A., Kuz’mina A.S., Novodvorsky O.A., Parshina L.S., Mikhalevsky V.A., Khramova O.D., Cherebilo E.A., Perov N.S., Makarova L.A., Shneider A.G., Kuz’min M.P.
Formation of Films of Tungsten and its Oxides in a High-Frequency Capacitive Discharge in a D2-O2 Mixture
Gorodetsky A.E., Zalavutdinov R.K., Bukhovets V.L., Markin A.V., Zakharov A.P., Zolotarevsky V.I., Voytitsky V.L., Rybkina T.V., Kazansky L.P., Arkhipushkin I.A., Mukhin E.E., Razdobarin A.G.
Anisotropic magnetoresistive transducers on the basis of a self-aligned structure
Djuzhev N.A., Iurov A.S., Mazurkin N.S., Preobrazhensky R.Y., Chinenkov M.Y.
Influence of the probe sizes on the parameters of the surface morphology of hemispherical-grain polysilicon films: Estimation via atomic-force microscopy
Novak A.V., Novak V.R.
High-coercivity magnetic mirror polarizers for thermal neutrons
Tatarskiy D.A., Gribkov B.A., Gusev N.S., Rogov V.V., Yunin P.A., Vdovichev S.N.
Structural Surface Features of Tellurium-Doped Bismuth Films
Matveev D.Y.
Propagation of Waves and Particles Through Porous Structures (I)
Filippov G.M., Aleksandrov V.A., Lysova I.V., Stepanov A.V.
Formation of Intermetallic Compounds during the Ion-Plasma Sputtering of Metal Films on Diamond
Berov Z.Z., Sozaev V.A., Manukyants A.R., Kasumov Y.N.
Vanadium- and Titanium Dioxide-Based Memristors Fabricated via Pulsed Laser Deposition
Novodvorsky O.A., Parshina L.S., Lotin A.A., Mikhalevsky V.A., Khramova O.D., Cherebylo E.A., Panchenko V.Y.
Evolution of surface morphology during the growth of amorphous and polycrystalline silicon films
Novak A.V., Novak V.R., Smirnov D.I.
Microstructure, phase analysis and dielectric response of thin Pb(Zr,Ti)O3 films at the morphotropic phase boundary
Pronin I.P., Pronin V.P., Kanareikin A.G., Dolgintsev D.M., Kaptelov E.Y., Senkevich S.V.
Influence of annealing on the structure of nanoporous oxide films on the surface of titanium‒aluminum powder alloy
Stepanova K.V., Yakovleva N.M., Kokatev A.N., Pettersson H.
Cermets as a versatile artificial material for the fabrication of cooled microbolometers for the microwave range
Vdovichev S.N., Vdovin V.F., Klimov A.Y., Mukhin A.S., Rogov V.V., Udalov O.G.
Atоmiс Force Microscopy of Graphene-Like Films Deposited onto Preirradiated SiO2/Si
Sedlovets D.M., Knyazev M.A., Trofimov O.V.
Investigation of the Local Photoconductivity of ZrO2(Y) Films with Embedded Au Nanoparticles by Conductive Atomic Force Microscopy
Liskin D.A., Filatov D.O., Gorshkov O.N., Antonov D.A., Antonov I.N., Shenina M.E., Novikov A.S.
Long-Wave Oscillations of the Intensity of an Electron Beam Specularly Reflected from the Surface of a Growing Heteroepitaxial Film
Shkornyakov S.M.
Grazing Incidence X-Ray Diffraction Study of Tantalum Thin Films
Yunin P.A., Drozdov Y.N., Gusev N.S.
Structural and Dielectric Properties of Organic Ferroelectric 2-Methylbenzimidazole
Balashova E.V., Krichevtsov B.B., Svinarev F.B., Zaitseva N.V., Pankova G.A.
Spontaneous polarization of finely disperse dielectrics with surface donor centers
Kharlamov V.F.
Effect of Co+-ion implantation on the composition and properties of free Si–Cu nanofilm structures
Isakhanov Z.A., Kodirov T., Halmatov A.S., Ruzibaeva M.K., Muhtarov Z.E., Umirzakov B.E.
Features of the electrical conductivity of Fe, Ni, Ti, and Pt nanoisland films: Hysteresis and ion-field processes
Tomilin S.V., Berzhansky V.N., Yanovsky A.S., Tomilina O.A.
Modification of YBa2Cu3O7–δ thin films by ion implantation
Vasiliev V.K., Korolev D.S., Korolev S.A., Masterov D.V., Mikhaylov A.N., Okhapkin A.I., Pavlov S.A., Parafin A.E., Yunin P.A., Skorokhodov E.V., Tetelbaum D.I.
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y.S., Borgardt N.I., Lazarenko P.I., Parsegova V.S., Prikhodko A.S., Sherchenkov A.A.
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