Cermets as a versatile artificial material for the fabrication of cooled microbolometers for the microwave range


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Abstract

In this paper the results of the investigation of Si-Crx resistive cermet films, which are promising for the development of broadband microbolometers of the microwave range, are presented. A model of the conductivity of cermet films based on the theory of transport in granular metals and diluted semiconductors is proposed.

About the authors

S. N. Vdovichev

Institute for Physics of Microstructures; Lobachevsky State University of Nizhny Novgorod; Alekseev State Technical University

Author for correspondence.
Email: vdovichev@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950; Nizhny Novgorod, 603950

V. F. Vdovin

Institute of Applied Physics; Alekseev State Technical University

Email: vdovichev@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950

A. Yu. Klimov

Institute for Physics of Microstructures

Email: vdovichev@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950

A. S. Mukhin

Institute of Applied Physics; Alekseev State Technical University

Email: vdovichev@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950

V. V. Rogov

Institute for Physics of Microstructures

Email: vdovichev@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950

O. G. Udalov

Institute for Physics of Microstructures; California State University

Email: vdovichev@ipmras.ru
Russian Federation, Nizhny Novgorod, 603950; Northridge, California, CA 91330

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