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Determination of the Relative Concentration of Deuterium Implanted into Beryllium by Elastic Peak Electron Spectroscopy
Afanas’ev V.P., Gryazev A.S., Kaplya P.S., Köppen M., Rybakova A.V.
Formation of Structure and Properties of Silumin on Electron-Beam Processing
Konovalov S.V., Zagulyaev D.V., Semin A.P., Ivanov Y.F., Gromov V.E.
Scanning Probe Microscopy of Magnetorheological Elastomers
Valiev K.K., Minaev A.Y., Stepanov G.V., Karnet Y.N., Yumashev O.B.
Electron Microscopic Study of Siliceous-Carbonate Rocks of the Domanikoid Type
Kuzmin V.A., Skibitskaya N.A.
Study of the Structure of Polyphthalocyanines by Transmission Electron Microscopy
Sedlovets D.M., Korepanov V.I., Khodos I.I.
Composition and Structure of a Nanofilm Multilayer System of the SiO2/Si/CoSi2/Si(111) Type Obtained via Ion Implantation
Ergashov Y.S., Umirzakov B.E.
Intense Pulsed Electron Beam Modification of Surface Layer Facing Formed on Hardox 450 Steel by Electrocontact Method
Kormyshev V.E., Ivanov Y.F., Gromov V.E., Konovalov S.V., Semin A.P.
On the possibility of applying the bers apparatus to modeling the processes of heat and mass transfer caused by electrons in a planar multilayer medium
Gladyshev Y.A., Kalmanovich V.V., Stepovich M.A.
Influence of annealing temperature and its atmosphere on the properties of zinc implanted silicon
Privezentsev V.V., Kulikauskas V.S., Zatekin V.V., Shcherbachev K.D., Tabachkova N.Y., Eidelman K.B., Ksenich S.V., Batrakov A.A.
On the current state of field-emission electronics
Egorov N.V., Sheshin E.P.
Use of scanning electron microscopy for the classification of rocks of oil and gas reservoirs
Kuzmin V.A., Skibitskaya N.A.
Dislocation glide in GaN films grown by the lateral-overgrowth method induced by low-energy electron-beam irradiation
Yakimov E.B., Vergeles P.S.
Orientational dependence of the creation and annihilation of electron–positron pairs in a single-crystal at high energies
Kalashnikov N.P., Olchak A.S.
On some problems of modeling the distributions of minority charge carriers generated by an electron beam in a semiconductor material
Seregina E.V., Stepovich M.A., Makarenkov A.M., Filippov M.N.
Symmetry properties of the phase of coexistence of superconductivity and antiferromagnetism in 2D systems with strong electron correlations
Val’kov V.V., Zlotnikov A.O.
Structural Phase State of Surface Alloyed Y2O3 Silumin After Electron beam Processing
Gromov V.E., Ivanov Y.F., Zagulyaev D.V., Petrikova E.A., Teresov A.D., Rubannikova Y.A., Semin A.P.
Transformation of the Electronic Characteristics of Ytterbium Nanofilms, Induced by Carbon-Monoxide Molecules Adsorbed on Their Surface
Kuzmin M.V., Mittsev M.A.
Formation and Evolution of Structure and Phase Composition of Hypoeutectoid Silumin on Electron Beam Processing
Semin A.P., Rubannikova Y.A., Ivanov Y.F., Gromov V.E., Zagulyaev D.V., Konovalov S.V.
Estimating the Crystallographic Structure of AlGaN/GaN Heterostructure Buffer Layers Using Symmetric and Asymmetric X-ray Schemes
Lutzau A.V., Temper E.M., Enisherlova K.L.
Test Object for SEM Calibration: 2. Correlation Analysis of SEM Signals
Novikov Y.A.
Synthesis of Rhenium-Silicide Microcrystals in a Tin Melt
Solomkin F.Y., Orekhov A.S., Sharenkova N.V., Khavrov G.D., Isachenko G.N., Zaitseva N.V., Klechkovskaya V.V.
Effect of High-Fluence Ion Irradiation on the Structure and Electrical Properties of Polycrystalline Diamond
Anikin V.A., Borisov A.M., Kazakov V.A., Kudrin A.V., Mashkova E.S., Morkovkin A.I., Ovchinnikov M.A., Pitirimova E.A.
Influence of Zn+-Ion Implantation on the Process of Sapphire Charging by an Electron Beam
Tatarintsev A.A., Privezentsev V.V., Rau E.I., Goryachev A.V.
Transmission Function: Effect of “Brightness-Body Rotation”
Afanas’ev V.P., Kaplya P.S.
Comparative analysis of methods for measurement of the surface potential of dielectrics charging under electron-beam irradiation in a scanning electron microscope
Rau E.I., Tatarintsev A.A., Kupreenko S.Y., Zaitsev S.V., Podbutsky N.G.
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