Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print)
ISSN 1819-7094 (Online)
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Keywords
Raman spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
atomic-force microscopy
channeling
ion implantation
magnetron sputtering
microhardness
microstructure
neutron diffraction
scanning electron microscope
scanning electron microscopy
silicon
simulation
small-angle neutron scattering
structure
surface
surface morphology
synchrotron radiation
thin films
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Keywords
Raman spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
atomic-force microscopy
channeling
ion implantation
magnetron sputtering
microhardness
microstructure
neutron diffraction
scanning electron microscope
scanning electron microscopy
silicon
simulation
small-angle neutron scattering
structure
surface
surface morphology
synchrotron radiation
thin films
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Author Details
Author Details
Polkovnikov, V. N.
Issue
Section
Title
File
Vol 11, No 1 (2017)
Article
Current status and development prospects for multilayer X-ray optics at the Institute for Physics of Microstructures, Russian Academy of Sciences
Vol 12, No 6 (2018)
Article
Current State of Development of a Microscope Operating at a Wavelength of 3.37 nm at the Institute of Physics of Microstructures of the Russian Academy of Sciences
Vol 13, No 1 (2019)
Article
Set of Multilayer X-Ray Mirrors for a Double-Mirror Monochromator Operating in the Wavelength Range of 0.41–15.5 nm
Vol 13, No 1 (2019)
Article
Microstructure and Density of Mo Films in Multilayer Mo/Si Mirrors
Vol 13, No 2 (2019)
Article
Mo/Si Multilayer Mirrors with B
4
C and Be Barrier Layers
Vol 13, No 2 (2019)
Article
On the Possibilities of Multilayer Mirrors for Measuring the Concentration of Boron Impurities in Diamond
Vol 13, No 2 (2019)
Article
Internal Stresses in Mo/Y Multilayer Mirrors
Vol 13, No 2 (2019)
Article
Aperiodic Mirrors Based on Multilayer Beryllium Systems
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