Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print)
ISSN 1819-7094 (Online)
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Keywords
Raman spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
atomic-force microscopy
channeling
ion implantation
magnetron sputtering
microhardness
microstructure
neutron diffraction
scanning electron microscope
scanning electron microscopy
silicon
simulation
small-angle neutron scattering
structure
surface
surface morphology
synchrotron radiation
thin films
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Keywords
Raman spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
atomic-force microscopy
channeling
ion implantation
magnetron sputtering
microhardness
microstructure
neutron diffraction
scanning electron microscope
scanning electron microscopy
silicon
simulation
small-angle neutron scattering
structure
surface
surface morphology
synchrotron radiation
thin films
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Author Details
Author Details
Seregina, E. V.
Issue
Section
Title
File
Vol 10, No 2 (2016)
Article
On some problems of modeling the distributions of minority charge carriers generated by an electron beam in a semiconductor material
Vol 11, No 5 (2017)
Article
On the possibility of using the Galerkin projection method to model the spatial distribution of minority charge carriers generated by an electron probe in a semiconductor
Vol 12, No 1 (2018)
Article
Analysis of the Three-Dimensional Model of Diffusion of Minority Charge Carriers Generated by an Electron Probe in a Heterogeneous Semiconductor Material by Means of Projection Methods
Vol 12, No 4 (2018)
Article
Estimation of the Heating of a Semiconductor Target Surface by a Low-Energy Electron Beam
Vol 13, No 6 (2019)
Article
On Estimating the Heating of the Surface of a Homogeneous Metal Target with a Low-Energy Electron Probe
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