Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print)
ISSN 1819-7094 (Online)
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Keywords
Raman spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
atomic-force microscopy
channeling
ion implantation
magnetron sputtering
microhardness
microstructure
neutron diffraction
scanning electron microscope
scanning electron microscopy
silicon
simulation
small-angle neutron scattering
structure
surface
surface morphology
synchrotron radiation
thin films
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Keywords
Raman spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
atomic-force microscopy
channeling
ion implantation
magnetron sputtering
microhardness
microstructure
neutron diffraction
scanning electron microscope
scanning electron microscopy
silicon
simulation
small-angle neutron scattering
structure
surface
surface morphology
synchrotron radiation
thin films
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Author Details
Author Details
Tashmukhamedova, D. A.
Issue
Section
Title
File
Vol 10, No 6 (2016)
Article
Emission and optical properties of SiO
2
/Si thin films
Vol 11, No 2 (2017)
Article
On the synthesis of nanoscale phases of metal silicides in the near-surface region of silicon and the study of their electronic structures by passing light
Vol 12, No 5 (2018)
Article
Study of the Influence of Implanted Atoms on the Coefficients of the Sputtering of Silicon and Silicon with a Thin Oxide Film
Vol 13, No 6 (2019)
Article
Effect of Ion Bombardment on the Density of States of Valence Electrons in CdS Films
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