High resolution X-ray studies of porous PbTe layers on silicon substrates

Аннотация

The structure of PbTe films after anodic electrochemical etching in Norr electrolyte is studied by high resolution X-ray diffractometry and reflectometry. Lattice defects before and after etching are estimated. The quantitative parameters of the pores are determined. The advantage of the complex application of high resolution X-ray methods for the determination of the real structure of lead-telluride porous films is shown.