Comparison of Algorithms for Determining the Thickness of Optical Coatings Online
- Authors: Isaev T.F.1, Kochikov I.V.2, Lukyanenko D.V.1, Tikhonravov A.V.2, Yagola A.G.1
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Affiliations:
- Faculty of Physics, Moscow State University
- Research Computer Center, Moscow State University
- Issue: Vol 59, No 3 (2019)
- Pages: 465-474
- Section: Article
- URL: https://journals.rcsi.science/0965-5425/article/view/180468
- DOI: https://doi.org/10.1134/S0965542519030102
- ID: 180468
Cite item
Abstract
The basic algorithms for determining the thicknesses of layers of deposited multilayer optical coatings are discussed and compared. Using a series of model numerical experiments, the advantage of one of these algorithms—the modified T-algorithm—is demonstrated; this algorithm reduces the influence of the effect of error accumulation in the determined thicknesses of layers.
About the authors
T. F. Isaev
Faculty of Physics, Moscow State University
Author for correspondence.
Email: temurisaev@gmail.com
Russian Federation, Moscow, 119992
I. V. Kochikov
Research Computer Center, Moscow State University
Author for correspondence.
Email: igor@kochikov.ru
Russian Federation, Moscow, 119992
D. V. Lukyanenko
Faculty of Physics, Moscow State University
Author for correspondence.
Email: lukyanenko@physics.msu.ru
Russian Federation, Moscow, 119992
A. V. Tikhonravov
Research Computer Center, Moscow State University
Author for correspondence.
Email: tikh@srcc.msu.ru
Russian Federation, Moscow, 119992
A. G. Yagola
Faculty of Physics, Moscow State University
Author for correspondence.
Email: yagola@physics.msu.ru
Russian Federation, Moscow, 119992
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