Comparison of Algorithms for Determining the Thickness of Optical Coatings Online


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The basic algorithms for determining the thicknesses of layers of deposited multilayer optical coatings are discussed and compared. Using a series of model numerical experiments, the advantage of one of these algorithms—the modified T-algorithm—is demonstrated; this algorithm reduces the influence of the effect of error accumulation in the determined thicknesses of layers.

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T. Isaev

Faculty of Physics, Moscow State University

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Email: temurisaev@gmail.com
俄罗斯联邦, Moscow, 119992

I. Kochikov

Research Computer Center, Moscow State University

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Email: igor@kochikov.ru
俄罗斯联邦, Moscow, 119992

D. Lukyanenko

Faculty of Physics, Moscow State University

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Email: lukyanenko@physics.msu.ru
俄罗斯联邦, Moscow, 119992

A. Tikhonravov

Research Computer Center, Moscow State University

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Email: tikh@srcc.msu.ru
俄罗斯联邦, Moscow, 119992

A. Yagola

Faculty of Physics, Moscow State University

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Email: yagola@physics.msu.ru
俄罗斯联邦, Moscow, 119992

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