Comparison of Algorithms for Determining the Thickness of Optical Coatings Online


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Abstract

The basic algorithms for determining the thicknesses of layers of deposited multilayer optical coatings are discussed and compared. Using a series of model numerical experiments, the advantage of one of these algorithms—the modified T-algorithm—is demonstrated; this algorithm reduces the influence of the effect of error accumulation in the determined thicknesses of layers.

About the authors

T. F. Isaev

Faculty of Physics, Moscow State University

Author for correspondence.
Email: temurisaev@gmail.com
Russian Federation, Moscow, 119992

I. V. Kochikov

Research Computer Center, Moscow State University

Author for correspondence.
Email: igor@kochikov.ru
Russian Federation, Moscow, 119992

D. V. Lukyanenko

Faculty of Physics, Moscow State University

Author for correspondence.
Email: lukyanenko@physics.msu.ru
Russian Federation, Moscow, 119992

A. V. Tikhonravov

Research Computer Center, Moscow State University

Author for correspondence.
Email: tikh@srcc.msu.ru
Russian Federation, Moscow, 119992

A. G. Yagola

Faculty of Physics, Moscow State University

Author for correspondence.
Email: yagola@physics.msu.ru
Russian Federation, Moscow, 119992

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