Comparison of Algorithms for Determining the Thickness of Optical Coatings Online
- Autores: Isaev T.F.1, Kochikov I.V.2, Lukyanenko D.V.1, Tikhonravov A.V.2, Yagola A.G.1
-
Afiliações:
- Faculty of Physics, Moscow State University
- Research Computer Center, Moscow State University
- Edição: Volume 59, Nº 3 (2019)
- Páginas: 465-474
- Seção: Article
- URL: https://journals.rcsi.science/0965-5425/article/view/180468
- DOI: https://doi.org/10.1134/S0965542519030102
- ID: 180468
Citar
Resumo
The basic algorithms for determining the thicknesses of layers of deposited multilayer optical coatings are discussed and compared. Using a series of model numerical experiments, the advantage of one of these algorithms—the modified T-algorithm—is demonstrated; this algorithm reduces the influence of the effect of error accumulation in the determined thicknesses of layers.
Palavras-chave
Sobre autores
T. Isaev
Faculty of Physics, Moscow State University
Autor responsável pela correspondência
Email: temurisaev@gmail.com
Rússia, Moscow, 119992
I. Kochikov
Research Computer Center, Moscow State University
Autor responsável pela correspondência
Email: igor@kochikov.ru
Rússia, Moscow, 119992
D. Lukyanenko
Faculty of Physics, Moscow State University
Autor responsável pela correspondência
Email: lukyanenko@physics.msu.ru
Rússia, Moscow, 119992
A. Tikhonravov
Research Computer Center, Moscow State University
Autor responsável pela correspondência
Email: tikh@srcc.msu.ru
Rússia, Moscow, 119992
A. Yagola
Faculty of Physics, Moscow State University
Autor responsável pela correspondência
Email: yagola@physics.msu.ru
Rússia, Moscow, 119992
Arquivos suplementares
