Contactless Measurement of the Surface Temperature of Objects from Their Infrared Radiation
- 作者: Bityukov V.1, Simachkov D.1
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隶属关系:
- Moscow Technological University (MIREA)
- 期: 卷 60, 编号 10 (2018)
- 页面: 1038-1045
- 栏目: Article
- URL: https://journals.rcsi.science/0543-1972/article/view/246315
- DOI: https://doi.org/10.1007/s11018-018-1315-7
- ID: 246315
如何引用文章
详细
A contactless method is presented for measuring the surface temperature of radioelectronics objects from their own infrared radiation. Metrological analysis of the contactless method was executed using the small perturbations method.
作者简介
V. Bityukov
Moscow Technological University (MIREA)
编辑信件的主要联系方式.
Email: bitukov@mirea.ru
俄罗斯联邦, Moscow
D. Simachkov
Moscow Technological University (MIREA)
Email: bitukov@mirea.ru
俄罗斯联邦, Moscow