Contactless Measurement of the Surface Temperature of Objects from Their Infrared Radiation


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Abstract

A contactless method is presented for measuring the surface temperature of radioelectronics objects from their own infrared radiation. Metrological analysis of the contactless method was executed using the small perturbations method.

About the authors

V. K. Bityukov

Moscow Technological University (MIREA)

Author for correspondence.
Email: bitukov@mirea.ru
Russian Federation, Moscow

D. S. Simachkov

Moscow Technological University (MIREA)

Email: bitukov@mirea.ru
Russian Federation, Moscow


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