An Optoelectronic Method of Contactless Measurement of the Profile of the Surface of Large Complexly Shaped Objects
- Autores: Dvoinishnikov S.V.1, Anikin Y.A.1, Kabardin I.K.1, Kulikov D.V.1, Meledin V.G.1
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Afiliações:
- Kutateladze Institute of Thermophysics, Siberian Branch of the Russian Academy of Sciences
- Edição: Volume 59, Nº 1 (2016)
- Páginas: 21-27
- Seção: Linear and Angular Measurements
- URL: https://journals.rcsi.science/0543-1972/article/view/245684
- DOI: https://doi.org/10.1007/s11018-016-0910-8
- ID: 245684
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Resumo
A new optoelectronic method of contactless measurement of the profile of the surface of large complexly shaped objects distinguished by a high degree of reliability and resistance to variations in the optical properties of the surface of objects over a broad range and to additive noise in the images is proposed. The method utilizes structurized illumination, phase triangulation, and identification of phase images with stepwise shift.
Sobre autores
S. Dvoinishnikov
Kutateladze Institute of Thermophysics, Siberian Branch of the Russian Academy of Sciences
Autor responsável pela correspondência
Email: dv.s@mail.ru
Rússia, Novosibirsk
Yu. Anikin
Kutateladze Institute of Thermophysics, Siberian Branch of the Russian Academy of Sciences
Email: dv.s@mail.ru
Rússia, Novosibirsk
I. Kabardin
Kutateladze Institute of Thermophysics, Siberian Branch of the Russian Academy of Sciences
Email: dv.s@mail.ru
Rússia, Novosibirsk
D. Kulikov
Kutateladze Institute of Thermophysics, Siberian Branch of the Russian Academy of Sciences
Email: dv.s@mail.ru
Rússia, Novosibirsk
V. Meledin
Kutateladze Institute of Thermophysics, Siberian Branch of the Russian Academy of Sciences
Email: dv.s@mail.ru
Rússia, Novosibirsk
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