An Optoelectronic Method of Contactless Measurement of the Profile of the Surface of Large Complexly Shaped Objects


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A new optoelectronic method of contactless measurement of the profile of the surface of large complexly shaped objects distinguished by a high degree of reliability and resistance to variations in the optical properties of the surface of objects over a broad range and to additive noise in the images is proposed. The method utilizes structurized illumination, phase triangulation, and identification of phase images with stepwise shift.

作者简介

S. Dvoinishnikov

Kutateladze Institute of Thermophysics, Siberian Branch of the Russian Academy of Sciences

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Email: dv.s@mail.ru
俄罗斯联邦, Novosibirsk

Yu. Anikin

Kutateladze Institute of Thermophysics, Siberian Branch of the Russian Academy of Sciences

Email: dv.s@mail.ru
俄罗斯联邦, Novosibirsk

I. Kabardin

Kutateladze Institute of Thermophysics, Siberian Branch of the Russian Academy of Sciences

Email: dv.s@mail.ru
俄罗斯联邦, Novosibirsk

D. Kulikov

Kutateladze Institute of Thermophysics, Siberian Branch of the Russian Academy of Sciences

Email: dv.s@mail.ru
俄罗斯联邦, Novosibirsk

V. Meledin

Kutateladze Institute of Thermophysics, Siberian Branch of the Russian Academy of Sciences

Email: dv.s@mail.ru
俄罗斯联邦, Novosibirsk

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