An Optoelectronic Method of Contactless Measurement of the Profile of the Surface of Large Complexly Shaped Objects

S. V. Dvoinishnikov; Yu. A. Anikin; I. K. Kabardin; D. V. Kulikov; V. G. Meledin

doi:10.1007/s11018-016-0910-8

An Optoelectronic Method of Contactless Measurement of the Profile of the Surface of Large Complexly Shaped Objects

Authors: Dvoinishnikov S.V.¹, Anikin Y.A.¹, Kabardin I.K.¹, Kulikov D.V.¹, Meledin V.G.¹
Affiliations:
1. Kutateladze Institute of Thermophysics, Siberian Branch of the Russian Academy of Sciences
Issue: Vol 59, No 1 (2016)
Pages: 21-27
Section: Linear and Angular Measurements
URL: https://journals.rcsi.science/0543-1972/article/view/245684
DOI: https://doi.org/10.1007/s11018-016-0910-8
ID: 245684

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Abstract

A new optoelectronic method of contactless measurement of the profile of the surface of large complexly shaped objects distinguished by a high degree of reliability and resistance to variations in the optical properties of the surface of objects over a broad range and to additive noise in the images is proposed. The method utilizes structurized illumination, phase triangulation, and identification of phase images with stepwise shift.