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Metrological Aspects of Measuring the Volume-Average Temperature of Filaments in Illuminating Lamps
Zakharov Y., Gots S., Bakhtizin R.
Using Variations in the Frequency of a Ring Oscillator to Measure the Thermal Resistance of Digital Integrated Circuits
Sergeev V., Teten’kin Y.
Variational Method of Calibration of Impedance Meters. Part 2. Implementation of Method
Surdu M.
Measurement of Blowout Resistance of Fibrous Sound-Proof Materials
Komkin A., L’vov V., Nesterov N.
Variational Method of Calibration of Impedance Meters. Part 1. Basic Assumptions
Surdu M.
Evaluation of the Fracture Toughness of Titanium Nitride Hardening Coatings According to Kinetic Indentation and Acoustic Emission Parameters
Kachanov V., Sokolov I., Matyunin V., Barat V., Bardakov V., Marchenkov A.
Microprocessor-Based System for Measuring the Modulus and Components of the Complex Resistance of a Two-Terminal Element in a Multiterminal Electrical Circuit
Sharonov G., Nefed’ev A.
Method of Assessing the Optical Resistance of an Irradiated Surface Under Laser Ablation
Privalov V., Shemanin V., Mkrtychev O.
Study of the Properties of High-Sensitivity Thermally-Stable Thin-Film Resistance Strain Gauges for Integral Pressure Sensors
Volokhov I., Gurin S., Vergazov I.
A Hardware-Software Complex for Measuring the Electrical Resistance of Metals and Alloys at High Temperatures
Chernoskutov M., Ivliev A., Meshkov V., Samoilov A., Sosnin A.
Reduction of Measurement Uncertainty by Taking into Account Correlation in Measurements and Temperature Scale Realization
Palencar R., Duris S., Durisova Z., Brokes V., Pavlasek P.
Investigation of the Reproducibility of Melting and Freezing Curves for Tin in a Miniature Cell
Vasil’ev E., Ignatov A., Kalinin M., Markin L.
Estimate of Errors in the Determination of Parameters of Linear Thermal Circuits of Semiconductor Devices Based on the Frequency Dependence of the Thermal Impedance
Sergeev V., Frolov I.
GET 59–2016, State Primary Standard of Unit of Thermal Conductivity and Unit of Thermal Resistance
Sokolov N., Sokolov A., Churilina N.
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