Tests Concerning Certain Types of Faults at the Scheme Inputs
- Authors: Kurbatskaia V.K.1
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Affiliations:
- Faculty of Computational Mathematics and Cybernetics
- Issue: Vol 43, No 3 (2019)
- Pages: 112-117
- Section: Article
- URL: https://journals.rcsi.science/0278-6419/article/view/176310
- DOI: https://doi.org/10.3103/S0278641919020055
- ID: 176310
Cite item
Abstract
Estimates are obtained for the Shannon function of the length of a diagnostic test with respect to cyclic shifts of scheme inputs, and for the Shannon function of fault detection and length of a diagnostic test with respect to a single stuck-at fault and a cyclic shift of scheme inputs.
About the authors
V. K. Kurbatskaia
Faculty of Computational Mathematics and Cybernetics
Author for correspondence.
Email: kurbatskaia.vk@gmail.com
Russian Federation, Moscow, 119991
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