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Tests Concerning Certain Types of Faults at the Scheme Inputs


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Resumo

Estimates are obtained for the Shannon function of the length of a diagnostic test with respect to cyclic shifts of scheme inputs, and for the Shannon function of fault detection and length of a diagnostic test with respect to a single stuck-at fault and a cyclic shift of scheme inputs.

Sobre autores

V. Kurbatskaia

Faculty of Computational Mathematics and Cybernetics

Autor responsável pela correspondência
Email: kurbatskaia.vk@gmail.com
Rússia, Moscow, 119991

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Declaração de direitos autorais © Allerton Press, Inc., 2019