电邮这篇文章 Tests Concerning Certain Types of Faults at the Scheme Inputs
- 作者: Kurbatskaia V.K.1
-
隶属关系:
- Faculty of Computational Mathematics and Cybernetics
- 期: 卷 43, 编号 3 (2019)
- 页面: 112-117
- 栏目: Article
- URL: https://journals.rcsi.science/0278-6419/article/view/176310
- DOI: https://doi.org/10.3103/S0278641919020055
- ID: 176310
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详细
Estimates are obtained for the Shannon function of the length of a diagnostic test with respect to cyclic shifts of scheme inputs, and for the Shannon function of fault detection and length of a diagnostic test with respect to a single stuck-at fault and a cyclic shift of scheme inputs.
作者简介
V. Kurbatskaia
Faculty of Computational Mathematics and Cybernetics
编辑信件的主要联系方式.
Email: kurbatskaia.vk@gmail.com
俄罗斯联邦, Moscow, 119991
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