Application of X-ray Diffraction Methods to Studying Materials
- 作者: Kovalev A.1, Tishchenko L.1, Shashurin V.1, Galinovskii A.1
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隶属关系:
- Bauman Moscow State Technical University
- 期: 卷 2017, 编号 13 (2017)
- 页面: 1186-1193
- 栏目: Methods of Studying the Structure and Properties of Materials
- URL: https://journals.rcsi.science/0036-0295/article/view/171962
- DOI: https://doi.org/10.1134/S0036029517130110
- ID: 171962
如何引用文章
详细
X-ray diffraction analysis methods and their application in studying materials, including nanomaterials, are reviewed. The physical phenomena served as the basis for these methods, the designs of the experimental apparatuses to be used to record X-ray diffraction patterns, and the algorithms of their analysis are considered. The advantages and disadvantages of each method are described, and advanced methods for investigating nanomaterials are proposed.
作者简介
A. Kovalev
Bauman Moscow State Technical University
编辑信件的主要联系方式.
Email: kovalevarta@gmail.com
俄罗斯联邦, Moscow
L. Tishchenko
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
俄罗斯联邦, Moscow
V. Shashurin
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
俄罗斯联邦, Moscow
A. Galinovskii
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
俄罗斯联邦, Moscow