Application of X-ray Diffraction Methods to Studying Materials
- Authors: Kovalev A.A.1, Tishchenko L.A.1, Shashurin V.D.1, Galinovskii A.L.1
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Affiliations:
- Bauman Moscow State Technical University
- Issue: Vol 2017, No 13 (2017)
- Pages: 1186-1193
- Section: Methods of Studying the Structure and Properties of Materials
- URL: https://journals.rcsi.science/0036-0295/article/view/171962
- DOI: https://doi.org/10.1134/S0036029517130110
- ID: 171962
Cite item
Abstract
X-ray diffraction analysis methods and their application in studying materials, including nanomaterials, are reviewed. The physical phenomena served as the basis for these methods, the designs of the experimental apparatuses to be used to record X-ray diffraction patterns, and the algorithms of their analysis are considered. The advantages and disadvantages of each method are described, and advanced methods for investigating nanomaterials are proposed.
About the authors
A. A. Kovalev
Bauman Moscow State Technical University
Author for correspondence.
Email: kovalevarta@gmail.com
Russian Federation, Moscow
L. A. Tishchenko
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
Russian Federation, Moscow
V. D. Shashurin
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
Russian Federation, Moscow
A. L. Galinovskii
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
Russian Federation, Moscow