Application of X-ray Diffraction Methods to Studying Materials
- Autores: Kovalev A.1, Tishchenko L.1, Shashurin V.1, Galinovskii A.1
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Afiliações:
- Bauman Moscow State Technical University
- Edição: Volume 2017, Nº 13 (2017)
- Páginas: 1186-1193
- Seção: Methods of Studying the Structure and Properties of Materials
- URL: https://journals.rcsi.science/0036-0295/article/view/171962
- DOI: https://doi.org/10.1134/S0036029517130110
- ID: 171962
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Resumo
X-ray diffraction analysis methods and their application in studying materials, including nanomaterials, are reviewed. The physical phenomena served as the basis for these methods, the designs of the experimental apparatuses to be used to record X-ray diffraction patterns, and the algorithms of their analysis are considered. The advantages and disadvantages of each method are described, and advanced methods for investigating nanomaterials are proposed.
Sobre autores
A. Kovalev
Bauman Moscow State Technical University
Autor responsável pela correspondência
Email: kovalevarta@gmail.com
Rússia, Moscow
L. Tishchenko
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
Rússia, Moscow
V. Shashurin
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
Rússia, Moscow
A. Galinovskii
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
Rússia, Moscow
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