Application of X-ray Diffraction Methods to Studying Materials
- Авторы: Kovalev A.1, Tishchenko L.1, Shashurin V.1, Galinovskii A.1
-
Учреждения:
- Bauman Moscow State Technical University
- Выпуск: Том 2017, № 13 (2017)
- Страницы: 1186-1193
- Раздел: Methods of Studying the Structure and Properties of Materials
- URL: https://journals.rcsi.science/0036-0295/article/view/171962
- DOI: https://doi.org/10.1134/S0036029517130110
- ID: 171962
Цитировать
Аннотация
X-ray diffraction analysis methods and their application in studying materials, including nanomaterials, are reviewed. The physical phenomena served as the basis for these methods, the designs of the experimental apparatuses to be used to record X-ray diffraction patterns, and the algorithms of their analysis are considered. The advantages and disadvantages of each method are described, and advanced methods for investigating nanomaterials are proposed.
Об авторах
A. Kovalev
Bauman Moscow State Technical University
Автор, ответственный за переписку.
Email: kovalevarta@gmail.com
Россия, Moscow
L. Tishchenko
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
Россия, Moscow
V. Shashurin
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
Россия, Moscow
A. Galinovskii
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
Россия, Moscow
![](/img/style/loading.gif)