Application of X-ray Diffraction Methods to Studying Materials
- Авторлар: Kovalev A.1, Tishchenko L.1, Shashurin V.1, Galinovskii A.1
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Мекемелер:
- Bauman Moscow State Technical University
- Шығарылым: Том 2017, № 13 (2017)
- Беттер: 1186-1193
- Бөлім: Methods of Studying the Structure and Properties of Materials
- URL: https://journals.rcsi.science/0036-0295/article/view/171962
- DOI: https://doi.org/10.1134/S0036029517130110
- ID: 171962
Дәйексөз келтіру
Аннотация
X-ray diffraction analysis methods and their application in studying materials, including nanomaterials, are reviewed. The physical phenomena served as the basis for these methods, the designs of the experimental apparatuses to be used to record X-ray diffraction patterns, and the algorithms of their analysis are considered. The advantages and disadvantages of each method are described, and advanced methods for investigating nanomaterials are proposed.
Авторлар туралы
A. Kovalev
Bauman Moscow State Technical University
Хат алмасуға жауапты Автор.
Email: kovalevarta@gmail.com
Ресей, Moscow
L. Tishchenko
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
Ресей, Moscow
V. Shashurin
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
Ресей, Moscow
A. Galinovskii
Bauman Moscow State Technical University
Email: kovalevarta@gmail.com
Ресей, Moscow
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