Автор туралы ақпарат

Tikhonravov, A. V.

Шығарылым	Бөлім	Атауы	Файл
Том 72, № 3 (2017)	Optics and Spectroscopy. Laser Physics	An error self-compensation mechanism for deposition of optical coatings with broadband optical monitoring
Том 72, № 6 (2017)	Condensed Matter Physics	The Validity of the Results of High-Performance Modeling of SiO₂ Film Growth
Том 73, № 3 (2018)	Condensed Matter Physics	A Method of Porosity Analysis of Deposited Thin Films: The Results of a Supercomputer Simulation
Том 73, № 4 (2018)	Optics and Spectroscopy. Laser Physics	Improving the Accuracy of Broad-Band Monitoring of Optical Coating Deposition
Том 74, № 2 (2019)	Optics and Spectroscopy. Laser Physics	Broad Band Optical Monitoring in the Production of Gain Flattening Filters for Telecommunication Applications
Том 74, № 2 (2019)	Physics of Condensed State of Matter	Dependence of the Thin Films Porosity On the Deposition Conditions: Results of the Molecular Dynamics Simulation
Том 73, № 6 (2018)	Optics and Spectroscopy. Laser Physics	Estimates Related to the Error Self-Compensation Mechanism in Optical Coatings Deposition