Estimates Related to the Error Self-Compensation Mechanism in Optical Coatings Deposition


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This paper introduces an estimate for the strength of the correlation of layer thickness errors in the process of coating deposition with broadband optical monitoring. It is shown that a strong effect of self-compensation of deposition errors is observed in the case of a strong correlation of layer thickness errors. An estimate for the strength of this effect is introduced. Theoretical conclusions are confirmed by comparison with practical deposition results that demonstrate the presence of a strong self-compensation effect.

作者简介

A. Tikhonravov

Research Computer Center, Moscow State University

Email: igor@kochikov.ru
俄罗斯联邦, Moscow, 119991

I. Kochikov

Research Computer Center, Moscow State University

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Email: igor@kochikov.ru
俄罗斯联邦, Moscow, 119991

I. Matvienko

Department of Physics, Moscow State University

Email: igor@kochikov.ru
俄罗斯联邦, Moscow, 119991

S. Sharapova

Research Computer Center, Moscow State University

Email: igor@kochikov.ru
俄罗斯联邦, Moscow, 119991

A. Yagola

Department of Physics, Moscow State University

Email: igor@kochikov.ru
俄罗斯联邦, Moscow, 119991

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