An error self-compensation mechanism for deposition of optical coatings with broadband optical monitoring


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Abstract

An error self-compensation mechanism is investigated for use during the deposition of optical coatings with broadband optical monitoring. The correlation of thickness errors caused by monitoring procedure is mathematically described. It is shown that this correlation of errors may result in the effect of selfcompensation of errors.

About the authors

A. V. Tikhonravov

Research Computer Center

Author for correspondence.
Email: tikh@srcc.msu.su
Russian Federation, Moscow, 119991

I. V. Kochikov

Research Computer Center

Email: tikh@srcc.msu.su
Russian Federation, Moscow, 119991

M. K. Trubetskov

Max Planck Institute of Quantum Optics

Email: tikh@srcc.msu.su
Germany, Garching, 85748

S. A. Sharapova

Research Computer Center

Email: tikh@srcc.msu.su
Russian Federation, Moscow, 119991

V. G. Zhupanov

Lutch Scientific Research Institution

Email: tikh@srcc.msu.su
Russian Federation, Podolsk, Moscow

A. G. Yagola

Department of Physics

Email: tikh@srcc.msu.su
Russian Federation, Moscow, 119991

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