An error self-compensation mechanism for deposition of optical coatings with broadband optical monitoring


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An error self-compensation mechanism is investigated for use during the deposition of optical coatings with broadband optical monitoring. The correlation of thickness errors caused by monitoring procedure is mathematically described. It is shown that this correlation of errors may result in the effect of selfcompensation of errors.

作者简介

A. Tikhonravov

Research Computer Center

编辑信件的主要联系方式.
Email: tikh@srcc.msu.su
俄罗斯联邦, Moscow, 119991

I. Kochikov

Research Computer Center

Email: tikh@srcc.msu.su
俄罗斯联邦, Moscow, 119991

M. Trubetskov

Max Planck Institute of Quantum Optics

Email: tikh@srcc.msu.su
德国, Garching, 85748

S. Sharapova

Research Computer Center

Email: tikh@srcc.msu.su
俄罗斯联邦, Moscow, 119991

V. Zhupanov

Lutch Scientific Research Institution

Email: tikh@srcc.msu.su
俄罗斯联邦, Podolsk, Moscow

A. Yagola

Department of Physics

Email: tikh@srcc.msu.su
俄罗斯联邦, Moscow, 119991

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