Chemical interaction of InAs, InSb, GaAs, and GaSb crystal surfaces with (NH4)2Cr2O7–HBr–citric acid etching solutions


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We have studied the chemical dissolution of InAs, InSb, GaAs, and GaSb crystals in (NH4)2Cr2O7–HBr–C6H8O7 solutions. The dissolution rate of the crystals has been measured as a function of etchant composition, and the kinetics of the chemical interaction of the semiconductors with solutions have been investigated in detail. The dissolution rate has been shown to be diffusion-limited. Citric acid helps to reduce the etch rate and improves the polishing performance of the etching solutions.

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V. Tomashyk

Lashkaryov Institute of Semiconductor Physics

编辑信件的主要联系方式.
Email: tomashyk@isp.kiev.ua
乌克兰, pr. Nauki 41, Kyiv, 03028

G. Malanych

Lashkaryov Institute of Semiconductor Physics

Email: tomashyk@isp.kiev.ua
乌克兰, pr. Nauki 41, Kyiv, 03028

A. Stanetskaya

Lashkaryov Institute of Semiconductor Physics

Email: tomashyk@isp.kiev.ua
乌克兰, pr. Nauki 41, Kyiv, 03028

A. Korchevoi

Lashkaryov Institute of Semiconductor Physics

Email: tomashyk@isp.kiev.ua
乌克兰, pr. Nauki 41, Kyiv, 03028

I. Levchenko

Lashkaryov Institute of Semiconductor Physics

Email: tomashyk@isp.kiev.ua
乌克兰, pr. Nauki 41, Kyiv, 03028

I. Stratiychuk

Lashkaryov Institute of Semiconductor Physics

Email: tomashyk@isp.kiev.ua
乌克兰, pr. Nauki 41, Kyiv, 03028

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