Chemical interaction of InAs, InSb, GaAs, and GaSb crystal surfaces with (NH4)2Cr2O7–HBr–citric acid etching solutions


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

We have studied the chemical dissolution of InAs, InSb, GaAs, and GaSb crystals in (NH4)2Cr2O7–HBr–C6H8O7 solutions. The dissolution rate of the crystals has been measured as a function of etchant composition, and the kinetics of the chemical interaction of the semiconductors with solutions have been investigated in detail. The dissolution rate has been shown to be diffusion-limited. Citric acid helps to reduce the etch rate and improves the polishing performance of the etching solutions.

Авторлар туралы

V. Tomashyk

Lashkaryov Institute of Semiconductor Physics

Хат алмасуға жауапты Автор.
Email: tomashyk@isp.kiev.ua
Украина, pr. Nauki 41, Kyiv, 03028

G. Malanych

Lashkaryov Institute of Semiconductor Physics

Email: tomashyk@isp.kiev.ua
Украина, pr. Nauki 41, Kyiv, 03028

A. Stanetskaya

Lashkaryov Institute of Semiconductor Physics

Email: tomashyk@isp.kiev.ua
Украина, pr. Nauki 41, Kyiv, 03028

A. Korchevoi

Lashkaryov Institute of Semiconductor Physics

Email: tomashyk@isp.kiev.ua
Украина, pr. Nauki 41, Kyiv, 03028

I. Levchenko

Lashkaryov Institute of Semiconductor Physics

Email: tomashyk@isp.kiev.ua
Украина, pr. Nauki 41, Kyiv, 03028

I. Stratiychuk

Lashkaryov Institute of Semiconductor Physics

Email: tomashyk@isp.kiev.ua
Украина, pr. Nauki 41, Kyiv, 03028

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML

© Pleiades Publishing, Ltd., 2017